Focused Ion Beam Scanning Electron Microscope (FIB-SEM) for SEM and precision vEM imaging at isotropic nanometer voxel size. Our Crossbeam-550 can operate at room temperature and cryogenic regimes thanks to Quorum cryo-module. Feature: Local charge compensation device, in-chamber plasma cleaner. Oxford Instruments Omniprobe 350-cryo micromanipulator for lift-out. Detectors: Secondary Electrons; InLens Secondary Electrons; in column Energy Selective Back Scattered (ESB) Electrons; SenseBSD for “TEM-like” imaging at low-dose regime; aSTEM for scanning-transmission electron microscopy imaging. Applications: Negative staining, STEM-in-SEM, FIB milling micro machining, vEM by FIB-SEM, Cryo-FIB-SEM volume imaging, cryo-lamellae preparations, Lift-out and serial Lift-out micromachining.