Scanning Electron Microscope for SEM and vEM imaging of large biological, material science samples and non-conductive specimens. Detectors: Secondary Electrons; InLens Secondary Electrons; in column Energy Selective Back Scattered (ESB) Electrons; Variable Pressure Secondary Electrons (C2D); SenseBSD for “TEM-like” imaging at low-dose regime; aSTEM for scanning-transmission electron microscopy imaging. Applications: STEM-in-SEM, Centimeter-wide surface characterization, vEM by Array Tomography.